The tariff classification of a metrology and inspection machine from Israel
The tariff classification of WEBFREX3ES from Japan
The tariff classification of the Cohu Ismeca NY32 from Malaysia
The tariff classification of wafer loaders from Japan
Classification of the AC-4780 Array Test System
Protest Number 2904-02-100316; Dual Beam System; Scanning Electron Microscope; Handling and Transport Equipment; ITA.
CD Measurement and Inspection Scanning Electron Microscope fitted with equipment specifically designed for the handling and transport of semiconductor wafers; Revocation of HQ 962435
The tariff classification of the Caliper 3oomm Overlay Measurement Tool from the United Kingdom
The tariff classification of Test Handlers from Switzerland
Protest 2809-98-100442; Automatic Pellicle Mounting System; Measuring or Checking Instruments, Other Optical Instruments and Appliances.