The tariff classification of the Cohu Ismeca NY32 from Malaysia
The tariff classification of wafer loaders from Japan
Classification of the AC-4780 Array Test System
Protest Number 2904-02-100316; Dual Beam System; Scanning Electron Microscope; Handling and Transport Equipment; ITA.
CD Measurement and Inspection Scanning Electron Microscope fitted with equipment specifically designed for the handling and transport of semiconductor wafers; Revocation of HQ 962435
The tariff classification of the Caliper 3oomm Overlay Measurement Tool from the United Kingdom
The tariff classification of Test Handlers from Switzerland
Protest 2809-98-100442; Automatic Pellicle Mounting System; Measuring or Checking Instruments, Other Optical Instruments and Appliances.
The tariff classification of Wafer Auto Loaders from Japan
The tariff classification of Nidek Flatness Tester Model FT-11, Nidek Flatness Tester Model FT-12, Nidek Flatness Tester Model FT-3D, Nidek Flatness Tester Model FT-900 and Himec Wafer Cassette Inspection Machine Model CA-008A from Japan