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The tariff classification of Nidek Flatness Tester Model FT-11, Nidek Flatness Tester Model FT-12, Nidek Flatness Tester Model FT-3D, Nidek Flatness Tester Model FT-900 and Himec Wafer Cassette Inspection Machine Model CA-008A from Japan
The tariff classification of the Cohu Ismeca NY32 from Malaysia
CD Measurement and Inspection Scanning Electron Microscope fitted with equipment specifically designed for the handling and transport of semiconductor wafers; Revocation of HQ 962435
Protest 0401-1996-100112; Compound Optical Microscopes Used for Semiconductor Inspection; Measuring or Checking Instruments; Headings 9011 and 9031; EN 90.11; Carl Zeiss, Inc. v. United States, CIT Slip Op. 98-86; HQs 954662 and 956638
Classification of the AC-4780 Array Test System
The tariff classification of Nikon Optistations from Japan.
The tariff classification of Wafer Auto Loaders from Japan
Protest 3901-97-101872; Dynamic Test Handlers
The tariff classification of wafer loaders from Japan
The tariff classification of inspection systems from Belgium