Protest 1704-02-100302; CD-Scanning Electron Microscope
CD Measurement and Inspection Scanning Electron Microscope fitted with equipment specifically designed for the handling and transport of semiconductor wafers; Revocation of HQ 962435
Protest 1001-98-102442; Measurement and Inspection SEM Microscope, Model MI-3080; Microscopes, Other than Optical Microscopes
The tariff classification of the Nova 200 NanoLab
Protest Number 2904-02-100316; Dual Beam System; Scanning Electron Microscope; Handling and Transport Equipment; ITA.
The tariff classification of Expida Dual Beam Semiconductor Apparatus from the Netherlands
The tariff classification of scanning electron microscopes from Czech Republic