The tariff classification of the Cohu Ismeca NY32 from Malaysia
The tariff classification of Nidek Flatness Tester Model FT-11, Nidek Flatness Tester Model FT-12, Nidek Flatness Tester Model FT-3D, Nidek Flatness Tester Model FT-900 and Himec Wafer Cassette Inspection Machine Model CA-008A from Japan
Classification of the AC-4780 Array Test System
CD Measurement and Inspection Scanning Electron Microscope fitted with equipment specifically designed for the handling and transport of semiconductor wafers; Revocation of HQ 962435
Protest 0401-1996-100112; Compound Optical Microscopes Used for Semiconductor Inspection; Measuring or Checking Instruments; Headings 9011 and 9031; EN 90.11; Carl Zeiss, Inc. v. United States, CIT Slip Op. 98-86; HQs 954662 and 956638
The tariff classification of Nikon Optistations from Japan.
The tariff classification of Wafer Auto Loaders from Japan
Protest 3901-97-101872; Dynamic Test Handlers
The tariff classification of wafer loaders from Japan
The tariff classification of inspection systems from Belgium